Package 'sorocs'

Title: A Bayesian Semiparametric Approach to Correlated ROC Surfaces
Description: A Bayesian semiparametric Dirichlet process mixtures to estimate correlated receiver operating characteristic (ROC) surfaces and the associated volume under the surface (VUS) with stochastic order constraints. The reference paper is:Zhen Chen, Beom Seuk Hwang, (2018) "A Bayesian semiparametric approach to correlated ROC surfaces with stochastic order constraints". Biometrics, 75, 539-550. <doi:10.1111/biom.12997>.
Authors: Zhen Chen [aut], Beom Seuk Hwang [aut], Weimin Zhang [cre]
Maintainer: Weimin Zhang <[email protected]>
License: GPL-3
Version: 0.1.0
Built: 2025-03-06 03:02:07 UTC
Source: https://github.com/wzhang17/sorocs

Help Index


The example data is meant to represent the dataset supplied by the Physician Reliability Study (PRS), which is explored in Section 5 of the paper. The 'sampledata' file contains the following variables:

Description

The example data is meant to represent the dataset supplied by the Physician Reliability Study (PRS), which is explored in Section 5 of the paper. The 'sampledata' file contains the following variables:

Usage

asrm

Format

A data frame with 129 rows and following variables:

STUDYID

Subject id

logREscoremean1

log value of mean of four Regional Experts¡¯ scores at setting 1

logREscoremean2

log value of mean of four Regional Experts¡¯ scores at setting 2

TN1

sum of the IE(International Experts)'s diagnoses for positive disease at setting 1

TN2

sum of the IE(International Experts)'s diagnoses for positive disease at setting 2

TN12

TN1+TN2

JN1

number of non-missing IE's diagnoses for positive disease at setting 1

JN2

number of non-missing IE's diagnoses for positive disease at setting 2

JN12

JN1+JN2

TNN1

sum of the IE's diagnoses for severe disease at setting 1

TNN2

sum of the IE's diagnoses for severe disease at setting 2

TNN12

TNN1+TNN2

JNN1

number of non-missing IE's diagnoses for severe disease at setting 1

JNN2

number of non-missing IE's diagnoses for severe disease at setting 2

JNN12

JNN1+JNN2

Source

https://doi.org/10.1111/biom.12997


A Bayesian Semiparametric Dirichlet Process Mixtures to Estimate Correlated ROC Surfaces with Stochastic Order Constraints

Description

A Bayesian nonparametric Dirichlet process mixtures to estimate the receiver operating characteristic (ROC) surfaces and the associated volume under the surface (VUS), a summary measure similar to the area under the curve measure for ROC curves. To model distributions flexibly, including their skewness and multi-modality characteristics a Bayesian nonparametric Dirichlet process mixtures was used. Between-setting correlations is handled by dependent Dirichlet process mixtures that have bivariate distributions with nonzero correlations as their bases. To accommodate ordering constraints, the stochastic ordering in the context of mixture distributions was adopted.

Usage

sorocs(
  nsim = 4,
  nburn = 2,
  Yvariable1,
  Yvariable2,
  gridY = seq(0, 5, by = 0.05),
  Xvariable1,
  Xvariable2,
  gam0 = -4.6,
  gam1 = 9.2,
  lamb0 = -4.6,
  lamb1 = 9.2,
  H = 30,
  L = 30,
  alpha1 = 1,
  alpha2 = 1,
  alpha3 = 1,
  lambda1 = 1,
  lambda2 = 1,
  mu1 = matrix(c(0.5, 0.5), 2, 1),
  mu2 = matrix(c(1, 1), 2, 1),
  mu3 = matrix(c(3, 3), 2, 1),
  m1 = c(0, 0),
  m2 = c(0, 0),
  m3 = c(0, 0),
  A1 = 10 * diag(2),
  A2 = 10 * diag(2),
  A3 = 10 * diag(2),
  Sig1 = matrix(c(1, 0.5, 0.5, 1), 2, 2),
  Sig2 = matrix(c(1, 0.5, 0.5, 1), 2, 2),
  Sig3 = matrix(c(1, 0.5, 0.5, 1), 2, 2),
  nu = 6,
  C0 = 10 * diag(2),
  a1 = 2,
  a2 = 2,
  b1 = 0.1,
  b2 = 0.1
)

Arguments

nsim

Number of simulations

nburn

Burn in number

Yvariable1

Dependent variable at setting 1

Yvariable2

Dependent variable at setting 2

gridY

a regular sequence spanning the range of Y variable

Xvariable1

independent variable at setting 1

Xvariable2

independent variable at setting 2

gam0

Initial value for the test score distributions (e.g., a priori information between different disease populations for a single test or between multiple correlated tests)

gam1

Initial value for the test score distributions

lamb0

Initial value forthe test score distributions

lamb1

Initial value for the test score distributions

H

trucation level number for Dirichlet process prior trucation approximation

L

trucation level number for Dirichlet process prior trucation approximation

alpha1

fixed values of the precision parameters of the Dirichlet process

alpha2

fixed values of the precision parameters of the Dirichlet process

alpha3

fixed values of the precision parameters of the Dirichlet process

lambda1

fixed values of the precision parameters of the Dirichlet process

lambda2

fixed values of the precision parameters of the Dirichlet process

mu1

fixed values of the bivariate normal parameters of the Dirichlet process

mu2

fixed values of the bivariate normal parameters of the Dirichlet process

mu3

fixed values of the bivariate normal parameters of the Dirichlet process

m1

fixed values of the bivariate normal parameters of the Dirichlet process

m2

fixed values of the bivariate normal parameters of the Dirichlet process

m3

fixed values of the bivariate normal parameters of the Dirichlet process

A1

Initial values of the bivariate normal parameters of the Dirichlet process

A2

Initial values of the bivariate normal parameters of the Dirichlet process

A3

Initial values of the bivariate normal parameters of the Dirichlet process

Sig1

Initial values of the inverse Wishart distribution parameters of the Dirichlet process

Sig2

Initial values of the inverse Wishart distribution parameters of the Dirichlet process

Sig3

Initial values of the inverse Wishart distribution parameters of the Dirichlet process

nu

Initial values of the inverse Wishart distribution parameters of the Dirichlet process

C0

Initial values of the inverse Wishart distribution parameters of the Dirichlet process

a1

Initial shape values of the inverse-gamma base distributions for the Dirichlet process

a2

Initial shape values of the inverse-gamma base distributions for the Dirichlet process

b1

Initial scale values of the inverse-gamma base distributions for the Dirichlet process

b2

Initial scale values of the inverse-gamma base distributions for the Dirichlet process

Value

A list of posterior estimates

References

Zhen Chen, Beom Seuk Hwang. (2018) A Bayesian semiparametric approach to correlated ROC surfaces with stochastic order constraints. Biometrics, 75, 539-550. https://doi.org/10.1111/biom.12997

Examples

library(MASS)
library(MCMCpack)
library(mvtnorm)
data(asrm)
Y1 <- asrm$logREscoremean2[1:10]
Y2 <- asrm$logREscoremean1[1:10]
X1 <-asrm$TN12[1:20]/asrm$JN12[1:10]
X2 <-asrm$TNN12[1:20]/asrm$JNN12[1:10]
try1 <- sorocs:::sorocs( H = 12, L = 12, Yvariable1 =Y1, Yvariable2= Y2,
                         gridY=seq(0,5,by=1), Xvariable1= X1, Xvariable2 =X2)